Integrated circuit device package having both wire bond and flip-chip interconnections and method of making the same

ABSTRACT

Die-down array integrated circuit (IC) device packages with enhanced thermal, electrical, and input/output properties are presented. A die-down array IC device package includes a heat spreader having a central cavity. A first substrate surface is coupled to the heat spreader. A central opening through the substrate overlaps the central cavity. Alternatively, the heat spreader is formed by coupling a ring-shaped body to a planar heat spreader. The first substrate surface is coupled to the ring-shaped body and the substrate central opening overlaps a central opening through the ring-shaped body. An array of electrically conductive terminals is coupled to a second substrate surface. An IC die is mounted to the heat spreader within the central cavity. Bond pads on the die are coupled to corresponding bond pads on the substrate with a plurality of wire bonds. Electrically conductive bumps on the die are coupled to corresponding bond pads on an interposer.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The invention relates generally to the field of integrated circuit (IC)device packaging technology and, more particularly to IC device packageswith enhanced thermal, electrical, and input/output (I/O) properties.

2. Related Art

IC semiconductor dies are typically mounted in or on a package that isattached to a printed circuit board (PCB). An array IC device packageincludes a plurality of electrically conductive terminals (e.g., solderballs, pins, pads, etc.) arranged in an array (i.e., columns and rows)on a bottom surface of a package substrate. Signals from an IC diemounted on a surface of the substrate are routed through the substrateto the electrically conductive terminals on the bottom surface. Theelectrically conductive terminals are configured to be attached to thePCB. Example array IC device packages include ball grid array (BGA), pingrid array (PGA), and land grid array (LGA) packages.

Array IC device packages can have die-up and die-down configurations. Indie-up packages, the IC die is mounted on a top surface of thesubstrate, opposite the surface to which the electrically conductiveterminals are attached. In die-down packages, the IC die is mounted onthe bottom surface of the substrate, on the same surface where theelectrically conductive terminals are located.

BRIEF SUMMARY OF THE INVENTION

The present invention is directed to integrated circuit (IC) devicepackages that provide enhanced thermal, electrical, and input/output(I/O) performance, and methods for making the same.

IC device packages are described herein having an IC die coupled to asubstrate with at least one wire bond, and an interposer coupled to theIC die in a flip-chip fashion. Example embodiments of the presentinvention are described below.

In an embodiment of the present invention, a die-down array IC devicepackage includes a heat spreader having a first surface with a centralcavity formed therein. The package further includes a substrate having afirst surface coupled to the first surface of the heat spreader. Anarray of electrically conductive terminals is coupled to a secondsurface of the substrate. A central opening through the substrateoverlaps the central cavity. The package further includes an IC die,which has a first surface mounted to the first surface of the heatspreader, within the central cavity. At least one wire bond couples atleast one bond pad on a second surface of the IC die to at least onebond pad on the second surface of the substrate. The package furtherincludes an interposer. A plurality of electrically conductive bumps onthe second surface of the IC die is coupled to corresponding bond padson a first surface of the interposer.

In another embodiment of the present invention, the die-down array ICdevice package includes an underfill material that fills a space betweenthe IC die and the interposer, and an encapsulating material thatencapsulates the IC die and the at least one wire bond.

In another embodiment of the present invention, the die-down array ICdevice package includes a heat slug coupled to a second surface of theinterposer.

In another embodiment of the present invention, the heat spreaderincludes a substantially planar body having opposing first and secondsurfaces, and a ring-shaped body having a central opening that is openat first and second surfaces of the ring-shaped body. The first surfaceof the ring-shaped body is coupled to the first surface of thesubstantially planar body. The second surfaces of the ring-shaped bodyand the substantially planar body form the first and second surfaces,respectively, of the heat spreader. The central opening through thering-shaped body and a portion of the first surface of the substantiallyplanar body that is exposed through the central opening form the centralcavity.

In another embodiment of the present invention, a method of making adie-down array IC device package includes the step of coupling a firstsurface of a substrate to a first surface of a heat spreader. The methodfurther includes the step of mounting a first surface of an IC die tothe first surface of the heat spreader, within a central cavity formedin the first surface of the heat spreader. The method further includesthe step of coupling a plurality of bond pads on a second surface of theIC die to corresponding bond pads on a second surface of the substratewith a plurality of wire bonds. The method further includes the step ofcoupling a first surface of an interposer to the second surface of theIC die so that a plurality of electrically conductive bumps on thesecond surface of the IC die is coupled to corresponding bond pads onthe first surface of the interposer.

In another embodiment of the present invention, the method furtherincludes the steps of filling a space between the IC die and theinterposer with an underfill material, and encapsulating the IC die andthe plurality of wire bonds with an encapsulating material.

In another embodiment of the present invention, the method furtherincludes the step of coupling a heat slug to a second surface theinterposer.

In another embodiment of the present invention, the method includes thestep of coupling a first surface of a ring-shaped body to a firstsurface of a substantially planar body to form the heat spreader. Secondsurfaces of the ring-shaped body and the substantially planar body formthe first and second surfaces of said heat spreader, respectively. Thecentral opening through the substrate overlaps a central opening throughthe ring-shaped body that is open at the first and second surfaces ofthe ring-shaped body.

Further embodiments, features, and advantages of the present invention,as well as the structure and operation of various example embodiments ofthe present invention, are described in detail below with reference tothe accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS/FIGURES

The accompanying drawings, which are incorporated herein and form a partof the specification, illustrate the present invention and, togetherwith the description, further serve to explain the principles of theinvention and to enable a person skilled in the pertinent art to makeand use the invention. The drawing in which an element first appears istypically indicated by the leftmost digit(s) in the correspondingreference number.

FIG. 1A illustrates a cross-sectional view of a conventional die-downBGA package with wire bond interconnections.

FIG. 1B illustrates a cross-sectional view of a conventional die-up BGApackage with flip-chip interconnections.

FIG. 2A illustrates a cross-sectional view of a die-down BGA package,having an interposer attached to a flip-chip mounted IC die, inaccordance with an example embodiment of the present invention.

FIGS. 2B and 2C illustrate top and bottom views, respectively, of theinterposer illustrated in FIG. 2A, in accordance with an exampleembodiment of the present invention.

FIG. 2D illustrates the die-down BGA package shown in FIG. 2A, having anunderfill material between the interposer and the IC die, in accordancewith an example embodiment of the present invention.

FIG. 3 illustrates a cross-sectional view of a die-down BGA package,having an interposer attached to a flip-chip mounted IC die and a heatslug attached to the interposer, in accordance with an exampleembodiment of the present invention.

FIG. 4 illustrates a cross-sectional view of a die-down BGA package,having a two-piece heat spreader, and an interposer attached to aflip-chip mounted IC die, in accordance with an example embodiment ofthe present invention.

FIG. 5 illustrates a cross-sectional view of a die-down BGA package,having a two-piece heat spreader, an interposer attached to a flip-chipmounted IC die, and a heat slug attached to the interposer, inaccordance with an example embodiment of the present invention.

FIGS. 6-9, 10A, and 10B show flowcharts providing example steps forassembling die-down array IC device packages with enhanced thermal,electrical, and/or input/output (I/O) performance, in accordance withexample embodiments of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

Overview

Some conventional array integrated circuit (IC) device packages havewire bond interconnections to couple signals of the IC die fromcorresponding bond pads on the active surface of the IC die to thepackage substrate. Other conventional array IC device packages haveflip-chip interconnections to couple signals of the IC die from an arrayof conductive bumps on the active surface of the IC die to the packagesubstrate. The package substrate has internal routing that electricallycouples the signals of the IC die to an array of electrically conductiveterminals on a bottom surface of the substrate, and the package istypically mounted to a printed circuit board (PCB).

Conventional array IC device packages having only wire bondinterconnections to route signals from the IC die suffer from limitedthermal and electrical performance. For example, thermal performance islimited because there is no direct thermal path from the active surfaceof the IC die to the PCB. Electrical performance is also limited becausethere is no direct electrical path for routing signals from the centerof the IC die to the PCB. For example, signals routed from the center ofthe IC die traverse a longer electrical path than signals routed from anedge. Relatively short electrical paths are desirable because theyintroduce less resistance than relatively long electrical paths. Signalstraversing relatively long electrical paths can experience significantdrops in potential due to the increased resistance.

Furthermore, conventional IC device packages having only wire bondinterconnections or having only flip-chip interconnections to routesignals from the IC die suffer from limited input/output (I/O)performance. In order to achieve more I/Os with wire bondinterconnections, the minimum pitch of the I/O pads on the IC die mustbe reduced accordingly. In order to route more I/Os from the IC die tothe PCB with flip-chip interconnections, more substrate layers arerequired. However, the cost of high-density substrates increases withthe number of layers required and, in some cases (e.g., when theflip-chip bump pitch is extremely dense), it is not possible withcurrent technology to manufacture a substrate having a high enoughdensity.

Therefore, what is needed are IC device packages that provide enhancedthermal, electrical, and I/O performance.

The present invention is directed to IC device packages having enhancedthermal, electrical, and I/O properties, and methods of making the same.In embodiments, an active surface of the IC die has at least one bondpad for wire bond interconnections to a package substrate, in additionto at least one electrically conductive bump for flip-chipinterconnection to an interposer. The substrate and the interposer areconfigured to be coupled to a PCB.

In embodiments, enhanced thermal properties are present due to a directthermal path from the active surface of the IC die to the PCB, throughthe interposer. In further embodiments, enhanced electrical propertiesare present due to a direct electrical path from the active surface ofthe IC die to the PCB, through the interposer. Additionally, becauseboth wire bond pads and flip-chip bumps are used to interconnectsignals, more I/O connections can be achieved compared to conventionalIC device packages having either wire bond or flip-chip interconnectionsalone.

While example embodiments of the present invention described below areillustrated with a die-down configuration, it is noted that they canalternatively be implemented with a die-up configuration.

In the next section, conventional IC device packages are described. Thesubsequent section then describes example IC device package embodimentsof the present invention, followed by a description of exampleembodiments for assembling IC device packages of the present invention.These embodiments are provided for illustrative purposes, and thepresent invention is not limited to these examples.

Conventional IC Device Packages

FIG. 1A illustrates a cross-sectional view of a conventional die-downball grid array (BGA) package 100. BGA package 100 includes an IC die105, a die attach adhesive 125, a heat spreader 110, and a packagesubstrate 120. BGA package 100 further includes a plurality of wirebonds 115, a plurality of solder balls 130, and an encapsulatingmaterial 135. IC die 105 is mounted to heat spreader 110 in a die-downconfiguration with die attach adhesive 125. A first surface of substrate120 is attached to heat spreader 110. Wire bonds 115 couple signals ofIC die 105 to a second surface of substrate 120. Solder balls 130 areattached to the second surface of substrate 120. Solder balls 130 arereflowed to attach BGA package 100 to a PCB (not shown in FIG. 1A).

A thermal path is present in BGA package 100 from the active surface ofIC die 105 to the PCB through encapsulating material 135. However,typical encapsulating materials 135 lack thermal conductivity.Alternatively, an indirect thermal path is present from the activesurface of IC die 105 to the PCB through adhesive 125, heat spreader110, substrate 120, and solder balls 130. Thus, BGA package 100 provideslimited thermal performance because there is no direct thermallyconductive path from the active surface of IC die 105 to the PCB. BGApackage 100 also provides limited electrical performance. For example,routing signals from the center of IC die 105 to substrate 120 with wirebonds 115 introduces increased resistance because wire bonds 115increase in length with distance from the edge of IC die 105. Theincreased resistance introduced by the longer electrical paths resultsin an undesirable drop in signal potential.

FIG. 1B illustrates a cross-sectional view of a conventional die-up BGApackage 150. BGA package 150 includes an IC die 155, a package substrate160, a plurality of electrically conductive bumps 170, a plurality ofsolder balls 175, and an underfill material 165. IC die 155 is mountedto a first surface of substrate 160 in a die-up configuration.Electrically conductive bumps 170 of an active surface of IC die 155 arecoupled to conductive pads on the first surface of substrate 160.Electrically conductive bumps 170 couple signals in IC die 155 tosubstrate 160. Underfill material 165 is applied between the activesurface of IC die 155 and the first surface of substrate 160. Solderballs 175 are attached to a second surface of substrate 160. Solderballs 175 are reflowed to attach BGA package 150 to a PCB (not shown inFIG. 1B).

BGA package 150 provides limited I/O performance because a high-densitysubstrate 160 with numerous routing layers would be needed toeffectively route a large number of signals from the array of conductivepads on the first surface of substrate 160, to which IC die 155 ismounted. Numerous routing layers are undesirable because the cost ofsubstrate 160 typically increases with the number of routing layers. Insome cases (e.g., when the flip-chip bump pitch is extremely dense), itis not be possible with current technology to manufacture a substrate160 having a high enough density.

IC Device Packages Having Both Wire Bond and Flip-Chip Interconnections

FIG. 2A illustrates a cross-sectional view of a die-down BGA package200, in accordance with an embodiment of the present invention. BGApackage 200 includes an IC die 205, a die attach material 215, a heatspreader 210 with a central cavity 255 formed therein, a packagesubstrate 220, and an interposer 240. BGA package 200 further includesan encapsulating material 260, a plurality of wire bonds 230, aplurality of corresponding bond pads 225, a plurality of electricallyconductive bumps 235, a plurality of solder balls 245, and a pluralityof solder balls 250.

A first surface 211 of heat spreader 210 has central cavity 255 formedtherein. Substrate 220 has a central opening 223 that is open at a firstsurface 221 and a second surface 222 of substrate 220. First surface 221of substrate 220 is coupled to first surface 211 of heat spreader 210.Central opening 223 through substrate 220 overlaps central cavity 255formed in heat spreader 210. IC die 205 is mounted in a die-downconfiguration with die attach adhesive 215 to first surface 211 incavity 255 of heat spreader 210. Solder balls 245 are coupled to secondsurface 222 of substrate 220.

Bond pads 225 are located on a peripheral area of an active surface 202of IC die 205. Wire bonds 230 connect bond pads 225 to second surface222 of substrate 220 (e.g., to traces, contacts, ground rings, groundplanes, voltage planes, etc. of substrate 220). Bond pads 225 can be anytype of signal pads of IC die 205, including I/O pads, voltage pads,ground pads, test pads, etc.

Electrically conductive bumps 235 are located on a central area ofactive surface 202 of IC die 205, and are arranged in any configuration,including an array (i.e., in columns and rows). Electrically conductivebumps 235 are flip-chip coupled to corresponding bond pads (not shown inFIG. 2A) on a first surface 241 of interposer 240. Solder balls 250 arecoupled to a second surface 242 of interposer 240. FIGS. 2B and 2Cillustrate example bond pad 236 and solder ball 250 configurations onfirst and second surfaces 241 and 242 of interposer 240, respectively,for BGA package 200 shown in FIG. 2A, according to an example embodimentof the present invention. It is noted that any number of bond pads 236and solder balls 250 may be present in interposer 240, as is desired forthe particular implementation.

Solder balls 245 and 250 are reflowed to attach BGA package 200 to aPCB. Solder balls 245 and 250 can be implemented with other types ofelectrically conductive terminals (e.g., pins, studs, other kinds ofballs, etc.).

An encapsulating material 260 encapsulates IC die 205 and wire bonds230. In another embodiment, shown in FIG. 2D, an underfill material 265fills a space between active surface 202 of IC die 205 and first surface241 of interposer 240. Underfill material 265 is typically appliedbefore encapsulating material 260, but can also be applied afterencapsulating material 260 is applied. Example materials for underfillmaterial 265 include conventional underfill materials, including siliconoxide, or any other kind of underfill material. Underfill material 265is typically different from encapsulating material 260 but, in somecases, underfill material 265 and encapsulating material 260 can be thesame material.

Example materials for heat spreader 210 include copper, aluminum,aluminum based alloys, copper based alloys, ferromagnetic materials,laminated copper/iron, other metals and combinations of metals/alloys,other thermally and/or electrically conductive materials (e.g.,ceramics, metallized plastics, etc.), and other materials describedelsewhere herein. Machining, etching, stamping, and other techniques canbe used to form central cavity 255 in first surface 211 of heat spreader210. Example materials for die attach adhesive 215 include epoxy, suchas a silver epoxy, solder, and other adhesive materials.

Example materials for substrate 220 include tape, laminate, ceramic,organic (e.g., BT, FR4, etc.), and other materials. Substrate 220 canhave one or more electrical routing layers, which can be constructedthrough lamination, build-up, or other processes. Substrate 220 canfurther include single or multi-layer electrical conductive traces orplanes.

Example materials for electrically conductive bumps 235 include lead/tinsolder, gold, gold/tin, other metal or metal composites, electricallyconductive epoxy, and other electrically conductive materials.

Example materials for interposer 240 include tape, metal, a substrate(e.g., laminate or ceramic), an IC, or any combination of thesematerials (e.g., tape with metal stiffener, tape with laminate orceramic substrate, IC with metal slug, etc). Reflow process, thermalcompression, thermal sonic bonding, and other methods can be used toattach interposer 240. Interposer 240 can be attached either beforewafer dice or singulation (i.e., when IC die 205 is in wafer form) orafter IC die 205 has been singulated, including when it is attached toheat spreader 210.

Advantageously, BGA package 200 includes both wire bond 230 andflip-chip 235 interconnections in the same package. Accordingly, BGApackage 200 significantly increases the number of I/O signals that canbe routed to and from IC die 205, without reducing the minimum pitch ofI/O pads on IC die 205 or requiring substrate 220 be high-density.Additionally, BGA package 200 has enhanced thermal properties due to themore direct thermal path from active surface 202 of IC die 205 to thePCB, through interposer 240. BGA package 200 also has enhancedelectrical properties due to the more direct electrical path from IC die205 to the PCB, through interposer 240.

FIG. 3 illustrates a cross-sectional view of a die-down BGA package 300,in accordance with an embodiment of the present invention. BGA package300 is similar to BGA package 200, shown in FIG. 2A, except a heat slug305 replaces solder balls 250 for additional thermal enhancement. Heatslug 305 has a first surface 306 coupled to second surface 242 ofinterposer 240. Heat slug 305 has a second surface 307, which isconfigured to be surface mounted to a PCB.

Example materials for heat slug 305 include copper, aluminum, othermetals or combinations of metals/alloys, ceramics, and other thermallyand/or electrically conductive materials. In an example embodiment, heatslug 305 is formed separately and then attached to interposer 240. Inanother embodiment, heat slug 305 is formed by depositing a platinglayer on second surface 242 of interposer 240. Heat slug 305 can also beformed in other ways.

Alternatively, in another embodiment, BGA package 300 is configuredwithout a separate heat slug 305. Instead, interposer 240 incorporatesthe function of heat slug 305, and second surface 242 of interposer 240is configured to be mounted to the PCB.

In BGA package 300, a single electrical signal can be routed from IC die205 to the PCB through heat slug 305. Accordingly, BGA package 300 isadvantageous for routing a single power, ground, or other signal of ICdie 205 to the PCB, through interposer 240 and heat slug 305.

In comparison, BGA package 200, shown in FIG. 2A, is advantageous forrouting multiple I/O signals from IC die 205, through the center of thepackage, to the PCB. Because BGA package 200 has solder balls 250instead of heat slug 305 (shown in FIG. 3), multiple I/O signals can berouted from IC die 205 to the PCB, through interposer 240 and solderballs 250. Accordingly, BGA package 200 provides a direct electricalpath for routing critical I/O signals with less resistance and thereforelittle drop in signal potential.

FIG. 4 illustrates a cross-sectional view of a die-down BGA package 400.BGA package 400 is similar to BGA package 200, shown in FIG. 2A, exceptthat package 400 includes a two-piece heat spreader formed from a planarheat spreader 410 and a ring-shaped body 420.

BGA package 400 includes IC die 205, planar heat spreader 410, adhesivematerial 215, ring-shaped body 420, substrate 220, and interposer 240.BGA package 400 further includes plurality of wire bonds 230, pluralityof corresponding bond pads 225, plurality of electrically conductivebumps 235, plurality of solder balls 245, and plurality of solder balls250. Elements in FIG. 4 are generally similar to the correspondingelements shown in FIG. 2, with differences described below.

BGA package 400 includes a two-piece heat spreader formed by couplingring-shaped body 420 to planar heat spreader 410. Ring-shaped body 420has a central opening that is open at a first surface 421 and a secondsurface 422 of ring-shaped body 420. In BGA package 200 shown in FIG.2A, central cavity 255 is formed in first surface 211 of heat spreader210. In BGA package 400 shown in FIG. 4, central cavity 255 is formed bycoupling first surface 421 of ring-shaped body 420 to a first surface411 of planar heat spreader 410 with adhesive material 215. Firstsurface 221 of substrate 220 is coupled to second surface 422 ofring-shaped body 420. Central opening 223 through substrate 220 overlapscentral cavity 255. IC die 205 is mounted with adhesive material 215 ina die-down configuration to first surface 411 of heat spreader 410,within central cavity 255. Solder balls 245 are coupled to secondsurface 222 of substrate 220.

Example materials for heat spreader 410 and ring-shaped body 420 includecopper, aluminum, aluminum based alloys, copper based alloys,ferromagnetic materials, laminated copper/iron, other metals andcombinations of metals/alloys, other thermally and/or electricallyconductive materials (e.g., ceramics, metallized plastics, etc.), andother materials described elsewhere herein. Heat spreader 410 andring-shaped body 420 are typically made from the same material (e.g., tomatch coefficients of thermal expansion (CTE)), but can be made fromdifferent materials.

Advantageously, BGA package 400, like BGA package 200, described above,includes both wire bond 230 and flip-chip 235 interconnections in thesame package. Therefore, BGA package 400 significantly increases thenumber of I/O signals that can be routed to and from IC die 205, withoutreducing the minimum pitch of I/O pads on IC die 205 or requiringsubstrate 220 be high-density. Additionally, BGA package 400 hasenhanced thermal properties due to the more direct thermal path fromactive surface 202 of IC die 205 to the PCB, through interposer 240. BGApackage 400 also has enhanced electrical properties due to the moredirect electrical path from IC die 205 to the PCB, through interposer240.

FIG. 5 illustrates a cross-sectional view of a die-down BGA package 500.BGA package 500 is similar to BGA package 400 of FIG. 4, except heatslug 305 replaces solder balls 250 for additional thermal enhancement,similarly to BGA package 300 shown in FIG. 3. First surface 306 of heatslug 305 is coupled to second surface 242 of interposer 240. Secondsurface 307 of heat slug 305 is configured to be mounted to a PCB.

Alternatively, in another embodiment, BGA package 500 is configuredwithout a separate heat slug 305. Instead, interposer 240 incorporatesthe function of heat slug 305, and second surface 242 of interposer 240is configured to be mounted to the PCB.

Method of Assembling a Thermal, Electrical, and/or I/O Enhanced Package

FIG. 6 shows flowchart 600, providing steps for assembling an array ICdevice package with enhanced thermal, electrical, and/or I/O properties,according to one or more embodiments of the present invention. FIGS.7-9, 10A, and 10B provide additional optional steps, according tofurther embodiments of the present invention. The steps of FIGS. 6-9,10A, and 10B do not necessarily have to occur in the order shown, aswill be apparent to persons skilled in the relevant art(s) based on theteachings herein. Other operational and structural embodiments will beapparent to persons skilled in the relevant art(s) based on thefollowing discussion. These steps are described in detail below.

Flowchart 600 is shown in FIG. 6, and begins with step 605. In step 605,a substrate is coupled to a heat spreader. For example, the substrate issubstrate 220, and the heat spreader is heat spreader 210, as shown inFIGS. 2A and 3.

In step 610, an IC die is mounted to the heat spreader. For example, asshown in FIGS. 2A and 3, the IC die is mounted in a central cavityformed in the heat spreader, and the IC die is IC die 205, the heatspreader is heat spreader 210, the central cavity is central cavity 255,and the substrate is substrate 220.

In step 615, a plurality of bond pads on the IC die are coupled tocorresponding bond pads on the substrate with wire bonds. For example,the IC die is IC die 205, the plurality of bond pads on the IC die isplurality of bond pads 225, the substrate is substrate 220, and the wirebonds are wire bonds 230, as shown in FIGS. 2A and 3-5.

In step 620, an interposer is coupled to the IC die so that a pluralityof electrically conductive bumps on the IC die are coupled tocorresponding bond pads on the interposer. For example, the IC die is ICdie 205, the plurality of electrically conductive bumps on the IC die isplurality of electrically conductive bumps 235, and the interposer isinterposer 240, as shown in FIGS. 2A and 3-5.

Alternatively, in another embodiment, flowchart 600 includes the stepshown in FIG. 7 for forming a two-piece heat spreader. In step 705, aring-shaped body is coupled to a substantially planar heat spreader toform the heat spreader described in steps 605 and 610 of FIG. 6. Forexample, the ring-shaped body is ring-shaped body 420, and the planarheat spreader is planar heat spreader 410, as shown in FIGS. 4 and 5.

In another example embodiment, flowchart 600 includes one or more of thesteps shown in FIG. 8. In step 805, an array of electrically conductiveterminals is formed on the substrate. For example, the array ofelectrically conductive terminals formed on the substrate is pluralityof solder balls 245, as shown in FIGS. 2A and 4.

In step 810, an array of electrically conductive terminals is formed onthe interposer. For example, the array of electrically conductiveterminals formed on the interposer is plurality of solder balls 250, asshown in FIGS. 2A and 4. The arrays of electrically conductive terminalsformed on the substrate in step 805 and on the interposer in step 810are configured to mount the package to a PCB.

In an alternate example embodiment, flowchart 600 includes one or moreof the steps shown in FIG. 9. In step 905, an array of electricallyconductive terminals is formed on the substrate. For example, the arrayof electrically conductive terminals on the substrate is plurality ofsolder balls 245, as shown in FIGS. 3 and 5. Alternatively, theterminals can be pins, pads, or other terminal type.

In step 910, a heat slug is coupled to the interposer. For example, theheat slug is heat slug 305, and the interposer is interposer 240, asshown in FIGS. 3 and 5. The array of electrically conductive terminalson the substrate and a surface of the heat slug are configured to mountthe package to a PCB.

In another example embodiment, flowchart 600 includes the step shown inFIG. 10A. In step 1005, a space between the active surface of the IC dieand the interposer is filled in with an underfill material. For example,the IC die is IC die 205, the active surface of the IC die is activesurface 202, the interposer is interposer 240, and the underfillmaterial is underfill material 265, as shown in FIG. 2D.

In another example embodiment, flowchart 600 includes the step shown inFIG. 10B. In step 1010, the IC die and the wire bonds are encapsulatedwith an encapsulating material. For example, the IC die is IC die 205,the wire bonds are wire bonds 230, and the encapsulating material isencapsulating material 260, as shown in FIGS. 2A, 2D, and 3-5.

Conclusion

While various embodiments of the present invention have been describedabove, it should be understood that they have been presented by way ofexample only, and not limitation. It will be apparent to persons skilledin the relevant art that various changes in form and detail can be madetherein without departing from the spirit and scope of the invention.Thus, the breadth and scope of the present invention should not belimited by any of the above-described exemplary embodiments, but shouldbe defined only in accordance with the following claims and theirequivalents.

1. A die-down array integrated circuit (IC) device package, comprising:a heat spreader having opposing first and second surfaces, wherein saidfirst surface of said heat spreader has a central cavity formed therein;a substrate having a first surface coupled to said first surface of saidheat spreader, and having an array of electrically conductive terminalson a second surface, wherein said substrate further has a centralopening that is open at said first and second surfaces of saidsubstrate, wherein said central opening overlaps said central cavity; anIC die having a first surface mounted to said first surface of said heatspreader within said central cavity; at least one wire bond that couplesat least one bond pad on a second surface of said IC die to at least onebond pad on said second surface of said substrate; and an interposerhaving opposing first and second surfaces, wherein a plurality ofelectrically conductive bumps on said second surface of said IC die iscoupled to corresponding bond pads on said first surface of saidinterposer.
 2. The die-down array IC device package of claim 1, whereinsaid array of electrically conductive terminals and said second surfaceof said interposer are configured to surface mount the package to aprinted circuit board (PCB).
 3. The die-down array IC device package ofclaim 1, wherein said second surface of said interposer has an array ofelectrically conductive terminals thereon, wherein said arrays ofelectrically conductive terminals on said second surfaces of saidsubstrate and said interposer are configured to surface mount thepackage to a printed circuit board (PCB).
 4. The die-down array ICdevice package of claim 3, wherein said arrays of electricallyconductive terminals on said second surfaces of said substrate and saidinterposer include an array of electrically conductive balls, pins,studs, or pads.
 5. The die-down array IC device package of claim 1,further comprising: a heat slug having opposing first and secondsurfaces, wherein said first surface of said heat slug is coupled tosaid second surface of said interposer, wherein said array ofelectrically conductive terminals and said second surface of said heatslug are configured to surface mount the package to a printed circuitboard (PCB).
 6. The die-down array IC device package of claim 1, whereinsaid at least one bond pad comprises a plurality of bond pads located ona peripheral area of said second surface of said IC die.
 7. The die-downarray IC device package of claim 1, wherein said plurality ofelectrically conductive bumps is located on a central area of saidsecond surface of said IC die.
 8. The die-down array IC device packageof claim 1, wherein said first surface of said IC die is coupled to saidfirst surface of said heat spreader with an adhesive material.
 9. Thedie-down array IC device package of claim 1, further comprising: anencapsulating material, wherein said encapsulating material encapsulatessaid IC die and said at least one wire bond.
 10. The die-down array ICdevice package of claim 1, further comprising: an underfill materialthat fills a space between said second surface of said IC die and saidfirst surface of said interposer.
 11. The die-down array IC devicepackage 1, wherein said heat spreader comprises: a substantially planarbody having opposing first and second surfaces, wherein said secondsurface of said substantially planar body comprises said second surfaceof said heat spreader; and a ring-shaped body having a central openingthat is open at a first surface and a second surface of said ring-shapedbody, wherein said first surface of said ring-shaped body is coupled tosaid first surface of said substantially planar body, and wherein saidsecond surface of said ring-shaped body comprises said first surface ofsaid heat spreader; wherein said central opening through saidring-shaped body and a portion of said first surface of saidsubstantially planar body that is exposed through said central openingthrough said ring-shaped body form said central cavity.
 12. The die-downarray IC device package of claim 11, wherein said array of electricallyconductive terminals and said second surface of said interposer areconfigured to surface mount the package to a printed circuit board(PCB).
 13. The die-down array IC device package of claim 11, whereinsaid second surface of said interposer has an array of electricallyconductive terminals thereon, wherein said arrays of electricallyconductive terminals on said second surfaces of said substrate and saidinterposer are configured to surface mount the package to a printedcircuit board (PCB).
 14. The die-down array IC device package of claim13, wherein said arrays of electrically conductive terminals on saidsecond surfaces of said substrate and said interposer include an arrayof electrically conductive balls, pins, studs, or pads.
 15. The die-downarray IC device package of claim 11, further comprising: a heat slughaving opposing first and second surfaces, wherein said first surface ofsaid heat slug is coupled to said second surface of said interposer,wherein said array of electrically conductive terminals and said secondsurface of said heat slug are configured to surface mount the package toa printed circuit board (PCB).
 16. The die-down array IC device packageof claim 11, wherein said at least one bond pad comprises a plurality ofbond pads located on a peripheral area of said second surface of said ICdie.
 17. The die-down array IC device package of claim 11, wherein saidplurality of electrically conductive bumps is located on a central areaof said second surface of said IC die.
 18. The die-down array IC devicepackage of claim 11, wherein said first surface of said IC die iscoupled to said first surface of said heat spreader with an adhesivematerial.
 19. The die-down array IC device package of claim 11, whereinsaid first surface of said ring-shaped body is coupled to said firstsurface of said substantially planar body with an adhesive material. 20.The die-down array IC device package of claim 11, further comprising: anencapsulating material, wherein said encapsulating material encapsulatessaid IC die and said at least one wire bond.
 21. The die-down array ICdevice package of claim 11, further comprising: an underfill materialthat fills a space between said second surface of said IC die and saidfirst surface of said interposer.
 22. A method of assembling a die-downarray integrated circuit (IC) device package, comprising: coupling afirst surface of a substrate to a first surface of a heat spreader,wherein said substrate has a central opening that is open at said firstsurface of said substrate and a second surface of said substrate,wherein said central opening overlaps a central cavity formed in saidfirst surface of said heat spreader; mounting a first surface of an ICdie to said first surface of said heat spreader within said centralcavity; coupling a plurality of bond pads on a second surface of said ICdie to corresponding bond pads on said second surface of said substratewith a plurality of wire bonds; and coupling a first surface of aninterposer to said second surface of said IC die, wherein a plurality ofelectrically conductive bumps on said second surface of said IC die arecoupled to corresponding bond pads on said first surface of saidinterposer.
 23. The method of claim 21, further comprising: forming anarray of electrically conductive terminals on said second surface ofsaid substrate, wherein the package is capable of being mounted to aprinted circuit board (PCB).
 24. The method of claim 21, furthercomprising: forming an array of electrically conductive terminals onsaid second surface of said substrate; and forming an array ofelectrically conductive terminals on a second surface of saidinterposer, wherein the package is capable of being mounted to a printedcircuit board (PCB).
 25. The method of claim 21, further comprising:coupling a heat slug to a second surface of said interposer.
 26. Themethod of claim 21, further comprising: filling a space between saidsecond surface of said IC die and said first surface of said interposerwith an underfill material.
 27. The method of claim 21, furthercomprising: encapsulating said IC die and said plurality of wire bondswith an encapsulating material.
 28. The method of claim 21, furthercomprising: coupling a first surface of a ring-shaped body to a firstsurface of a substantially planar body to form said heat spreader,wherein second surfaces of said ring-shaped body and said substantiallyplanar body comprise said first and second surfaces of said heatspreader, respectively, and wherein said central opening through saidsubstrate overlaps a central opening through said ring-shaped body thatis open at said first and second surfaces of said ring-shaped body.